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Low Pressure Chemical Vapour Deposition Furnace for Low Temperature Silicon Dioxide
Centrotherm
Usage
- Modus Operandi:
Service-Mode - Contamination category:
A - Sample-size:
up to 25 wafers per run; 9 samples (max. 2x2 cm)
FOM-Name and Location
- FOM-Name:
- AMO - LPCVD-LTO - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
LTO (low temp. SiO2); 425°C; SiH4 and O2 process; up to 500 nm
- Modus Operandi:
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Low Pressure Chemical Vapour Deposition Furnace for Polycrystalline Silicon
Centrotherm
Usage
- Modus Operandi:
Service-Mode - Contamination category:
A - Sample-size:
up to 25 wafers per run; 15x15 cm tray for samples
FOM-Name and Location
- FOM-Name:
- AMO - LPCVD-Poly - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
Polysilicon; 620°C; SiH4 process; up to 500 nm
- Modus Operandi:
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Photolithography System (Mask Aligner)
SÜSS MicroTec, MA4
Usage
- Modus Operandi:
User-mode - Contamination category: A,B,C if appropriate chucks and masks are used
- Sample-size:
Pieces ... 4″
FOM-Name and Location
- FOM-Name:
– IHT – Optical Lithography (MA4) - Location: WSH, Room 24B103
Resources
- Tool manager:
Birger Berghoff - Instruction video:
Open video - Tool description:
- Modus Operandi:
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Photolithography System
SÜSS MicroTec, MJB3
Usage
- Modus Operandi:
User-mode - Contamination category: B, C
- Sample-size:
Pieces ... 3″
FOM-Name and Location
- FOM-Name:
- Physik - Photolithography System (MJB3) - Location:
Physikzentrum, Room 28A313
Resources
- Tool manager:
Arne Hollmann - Instruction video:
Open video - Tool description:
SÜSS MicroTec, MJB3
- Modus Operandi:
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Photolithography System (Mask Aligner / Bond Aligner)
SÜSS MicroTec, MA/BA6
Usage
- Modus Operandi:
User-mode - Contamination category: A,B,C if appropriate chuck and masks are used
- Sample-size:
Pieces ... 6″ wafer
FOM-Name and Location
- FOM-Name:
Optical Lithography (MABA6) - Location:
CMNT, Room 009
Resources
- Tool manager:
Birger Berghoff - Instruction video:
Open video - Tool description:
Top- and back-side alignment
- Modus Operandi:
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Plasma-Enhanced Chemical Vapor Deposition System
Oxford Instruments, PlasmaLab 80 Plus
Usage
- Modus Operandi:
... - Contamination category: C
- Sample-size:
Pieces ... 4″
FOM-Name and Location
- FOM-Name:
PECVD (Petzi) - Location:
CMNT, Room 004
Resources
- Tool manager:
Jan Gruis - Instruction video:
Open video - Tool description:
Oxford Instruments, PlasmaLab 80 Plus
Parallel-plate PECVD
Process gases: SiH4, O2, NH3
- Modus Operandi:
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Photolithography System (Mask Aligner)
EVG, 420
Usage
- Modus Operandi:
Service-Mode - Contamination category:
C - Sample-size:
from samples of 10×10 mm² up to 6" wafers
FOM-Name and Location
- FOM-Name:
- AMO - Mask Aligner (EVG 420) - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
6" semi-automatic mask aligner; 2 µm resolution
- Modus Operandi:
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Photolithography System (Mask Aligner)
SÜSS MicroTec, MA6
Usage
- Modus Operandi:
Service-Mode - Contamination category:
C - Sample-size:
100 mm, 150 mm Wafer
FOM-Name and Location
- FOM-Name:
- Mask Aligner MA 6 - Location:
ZMNT, Room 009
Resources
- Tool manager:
Jochen Heiss - Instruction video:
Not available - Tool description:
Mask Aligner and Bond Aligner, UV NIL Tooling
- Modus Operandi:
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Photolithography System (Stepper)
Canon, FPA 3000 i5+
Usage
- Modus Operandi:
Service-Mode - Contamination category:
B - Sample-size:
only 6" wafers; no samples
FOM-Name and Location
- FOM-Name:
- AMO - Stepper - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
6" i-line Stepper with 0.5 μm resolution
- Modus Operandi:
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Plasma Asher
Alpha Plasma, PP35
Usage
- Modus Operandi:
User-mode - Contamination category: C
- Sample-size:
Pieces ... 4″
FOM-Name and Location
- FOM-Name:
- Physik - Plasma Asher - Location:
Physikzentrum, Room 28A313
Resources
- Tool manager:
Lars Schreiber - Instruction video:
Open video - Tool description:
Alpha Plasma, PP35
- Modus Operandi:
Back to overview of tools.