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Plasma Asher
Tegal, 915
Usage
- Modus Operandi:
User-mode - Contamination category: B,C (B if appropriate handling wafer is used)
- Sample-size:
Pieces ... 6″ wafers
FOM-Name and Location
- FOM-Name:
N.N. - Location:
CMNT, Room 009
Resources
- Tool manager:
Jochen Heiss - Instruction video:
Open video - Tool description:
Tegal, 915
- Modus Operandi:
- Continue reading →
Barrel Plasma Asher/SF6 Plasma Etcher
Oxford Instruments, Plasmalab PRS 90
Usage
- Modus Operandi:
User-mode - Contamination category:
B,C if appriate handle wafers are used - Sample-size:
Pieces ... 6″ wafers
FOM-Name and Location
- FOM-Name:
– IHT – Plasma Asher - Location:
WSH, Room 24B132
Resources
- Tool manager: Birger Berghoff
- Instruction video: Open video
- Tool description:
- Modus Operandi:
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Rapid Thermal Processing Furnace
Jipelec, JetFirst
Usage
- Modus Operandi:
Service-Mode - Contamination category:
C - Sample-size:
up to 6" wafers; 6" dummy wafer for samples
FOM-Name and Location
- FOM-Name:
- AMO - RTP - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
6″ Rapid Thermal Annealing system up to 1100°C; process gases H2, N2, Ar
- Modus Operandi:
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Reactive-Ion Etching System
Tegal, 901
Usage
- Modus Operandi:
User-Mode - Contamination category:
C - Sample-size:
100 mm Wafer
FOM-Name and Location
- FOM-Name:
- RIE (Tegal 901) - Location:
ZMNT, Room 006
Resources
- Tool manager:
Jochen Heiss - Instruction video:
Not available - Tool description:
Etching gases: N2, O2, CHF3, CF4, SF6, Ar
- Modus Operandi:
- Continue reading →
Reactive-Ion Etching System
Oxford Instruments, RIE 80
Usage
- Modus Operandi:
User-Mode - Contamination category:
C - Sample-size:
100 mm, 150 mm Wafer
FOM-Name and Location
- FOM-Name:
- RIE (RIE 80) - Location:
ZMNT, Room 006
Resources
- Tool manager:
Jochen Heiss - Instruction video:
Not available - Tool description:
Etching gases: N2, O2, CHF3, CF4, SF6, Ar
- Modus Operandi:
- Continue reading →
Parallel-Plate Reactive Ion Etching Tool
MRC, RIE-51
Usage
- Modus Operandi:
User-mode - Contamination category: A, B, C
- Sample-size:
Pieces ... 4″
FOM-Name and Location
- FOM-Name:
RIE 51 - Location:
WSH, Room 24B131
Resources
- Tool manager:
Birger Berghoff - Instruction video:
Open video - Tool description:
SF6, CHF3, O2 and BCl3 based etching
- Modus Operandi:
- Continue reading →
Rapid Thermal Processing Furnace
Annealsys, AS-One 150
Usage
- Modus Operandi:
User-mode - Contamination category: A, B
- Sample-size:
Pieces ... 6″ wafers
FOM-Name and Location
- FOM-Name:
– IHT – RTP (AS-One 150) - Location:
WSH, Room 24B101
Resources
- Tool manager:
Birger Berghoff - Instruction video:
Open video - Tool description:
Cold-wall RTP with stainless steel chamber,
high vacuum,
annealing in pure hydrogen possible,
process gases: Ar, NH3, O2, H2
- Modus Operandi:
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Rapid Thermal Processing Furnace
UniTemp, RTP 150
Usage
- Modus Operandi:
User-mode - Contamination category: C
- Sample-size:
Pieces ... 6″ wafers
FOM-Name and Location
- FOM-Name:
– IHT – RTP (RTP 150) - Location:
WSH, Room 24B309
Resources
- Tool manager:
Birger Berghoff - Instruction video:
Open video - Tool description:
Inert gas (Ar) annealing,
Forming gas annealing,
Oxidation (O2)
- Modus Operandi:
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SCIL UV Nanoimprint Lithography System
SÜSS MicroTec, MA8 Gen3
Usage
- Modus Operandi:
Service-Mode - Contamination category:
B - Sample-size:
2" - 8" wafers
FOM-Name and Location
- FOM-Name:
- AMO - SCIL UV Nanoimprint - Location:
AMO
Resources
- Tool manager:
AMO - Instruction video:
Not available - Tool description:
SCIL 2″-8″ UV-Nanoimprint Lithography
- Modus Operandi:
- Continue reading →
Single-Wafer Cleaning System
acp, Corwet 200M
Usage
- Modus Operandi:
User-mode - Contamination category: A, B
- Sample-size:
4″ wafers only
FOM-Name and Location
- FOM-Name:
Single-Wafer Cleaner - Location:
CMNT, Room 001
Resources
- Tool manager:
Birger Berghoff - Instruction video:
- Tool description:
- Modus Operandi:
Back to overview of tools.